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Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3
Figure 1: Topographs acquired in constant Δf NC-AFM of Si(100) at 5 K, demonstrating different imaging mechan...
Figure 2: Larger scans of (a) inverted and (b) high-setpoint inverted images presented in Figure 1b and Figure 1c. In a) the la...
Figure 3: Experimental short-range force (nN) and dissipation (eV/cycle) as a function of relative tip–sample...